Oxford WITec alpha300 series
Benefits: Identification and visualization of the distribution of chemical compounds
Features: Analysis of crystallinity and material stress properties
Features: Lateral, diffraction-limited spatial resolution down to ~200 nm
Applications: Correlative imaging options readily available (i.e. fluorescence microscopy, AFM, SNOM, SEM, TERS)
Key features and benefits
• True confocality, ideally suited to depth profiling and 3D Raman
image generation
• Lateral resolution limited only by physical law
• Spectral resolution down to 0.1 cm-1 relative wavenumbers
(@633 nm excitation)
• Focus stabilization compensates for thermal and mechanical
variations during long-term measurements
• Laser wavelength selectable from UV to NIR
• Throughput-optimized UHTS spectrometers with a variety of focal
lengths
• Fast Raman Imaging™ and Ultrafast Raman Imaging with
motorized or piezo-driven scanning stages
• 3D images and depth profiles with motorized or piezo-driven
scanning stages
